Security-Driven Metrics and Models for Efficient Evaluation of Logic Encryption Schemes

TitleSecurity-Driven Metrics and Models for Efficient Evaluation of Logic Encryption Schemes
Publication TypeConference Paper
Year of Publication2019
AuthorsY. Hu, V. V. Menon, A. Schmidt, J. Monson, M. C. French, and P. Nuzzo
Conference NameProceedings of the 17th ACM-IEEE International Conference on Formal Methods and Models for System Design
Conference LocationNew York, NY, USA
URLhttps://doi.org/10.1145/3359986.3361207